Vibrating apparatus, driving apparatus having the vibrating apparatus, and optical device

ABSTRACT

A vibration apparatus includes a vibrating body that includes a piezoelectric material having a lead content of less than 1000 ppm, and has an electromechanical energy converting element having an electrode; and a control unit that applies at least two driving voltages to the electromechanical energy converting element, and generates a combined vibration by providing a time phase difference to the vibrating body and generating multiple stable waves having mutually different orders; wherein the control unit changes at least one of the voltage amplitude ratio and time phase difference of at least two driving voltages, so as to change the amplitude distribution of the combined vibration.

BACKGROUND OF THE INVENTION

1. Field of the Invention

One disclosed aspect of the embodiments relates to a vibratingapparatus, driving apparatus having the vibrating apparatus, and opticaldevice. Particularly, one embodiment relates to an optical device suchas a camera, facsimile, scanner, projector, photocopier, laser printer,inkjet printer, lens, binoculars, image display devices, and so forth.Also, one embodiment relates to an vibrating device used for a dustremoval apparatus for such an optical device, and a driving device todrive a driven member by vibrating.

2. Description of the Related Art

In imaging apparatuses in recent years, resolution of optical sensorshas improved markedly, and accordingly dust that adheres to the opticalsystem during use has influenced imaged images.

In particular, resolution of imaging devices that are video cameras andstill cameras has been significantly improving, whereby when dustadheres to the optical device that is disposed on the optical path nearthe imaging device, image defects may occur.

For example, when dust from the outside or abrasion powder generatedfrom internal mechanical surfaces in sliding contact adheres to aninfrared-cut filter, an optical low-pass filter, or the like, the imageon the imaging device face has little blurring so the dust may show upin the imaged image.

On the other hand, imaging units such as copier, facsimile, scanner, orthe like read a flat document by scanning a line sensor or by scanning adocument that is placed near a line sensor.

When dust adheres to the light beam incident portion towards the linesensor, the dust may show up on the scanned image.

Also, with a method for so-called scan-reading where a document is readduring transport from a device with a method to scan a document, areading portion of a facsimile, or an automated document sending deviceof a photocopier, there are cases where one piece of dust may show up asa continuous line image in the document sending direction.

Thus, a problem occurs in that image quality is significantly lost.

Image quality may be recovered by wiping away the dust by hand, but thedust adhered during use has to be confirmed after photographing.

In the meantime, the image of dust shows up on the photographed orscanned image, so corrections have to be made by image processing withsoftware, and a photocopier outputs the image to paper media at the sametime so correction takes much work.

To address such problems, with the related art, a dust removal apparatusthat moves dust from the image reading portion by applying vibrations,and optical devices having the dust removal apparatus installed thereinhave been proposed (see Japanese Patent Laid-Open No. 2008-207170).

FIG. 13A is a diagram illustrating a configuration of a vibrationapparatus of a dust removal apparatus with the related art which isdisclosed in Japanese Patent Laid-Open No. 2008-207170. A vibrationapparatus 300 is provided to an imaging device 301 that converts thereceived subject image into electrical signals and creates image data.Space in front of the front face of the imaging device 301 is sealed offby the vibration apparatus 300 and imaging device 301. That is to say,the vibration apparatus 300 is joined to the front face side of theimaging device 301 so as to seal off the space via a sealing member orthe like. The vibration apparatus 300 is made up of an optical device302 having a rectangular plate shape and a pair of piezoelectricelements 303 a and 303 b which are electromechanical energy conversiondevices that are fixed to both sides of the optical device 302 by anadhesive. An alternating voltage Va is applied to the piezoelectricelement 303 a as a driving voltage, and an alternating voltage Vb isapplied to the piezoelectric element 303 b as a driving voltage.

The label A in FIG. 13B indicates a displacement distribution of aprimary out-of-plane bending vibration (standing wave), and the label Bindicates a displacement distribution of a secondary out-of-planebending vibration (standing wave). The vertical axis shows the directionof the imaging device 301 side to be negative, with a displacement ofthe out-of-plane direction of the front face on the opposite side fromthe side where the imaging device 301 of the vibration apparatus 300 isdisposed. The horizontal axis corresponds to the position in thelengthwise direction of the vibration apparatus 300 as illustrated inthe diagram. The alternating voltage Va and alternating voltage Vbtogether are a cyclic alternating voltage that has a response to theresonance phenomenon of the primary out-of-plane bending vibration andsecondary out-of-plane bending vibration, and further the alternatingvoltage Va and alternating voltage Vb have difference temporal phases.Thus, a combined vibration, where the two vibrations of the primaryout-of-plane bending vibration and secondary out-of-plane bendingvibration having different temporal phases are synthesized, is excitedin the vibration apparatus 300.

FIGS. 14 through 17 are graphs illustrating, for each time phase, theprimary out-of-plane bending vibration and secondary out-of-planebending vibration in the case that the two vibrations have temporalphase difference of 90° and an amplitude of 1:1, and the displacementand displacement speed of the vibrating bodies having these vibrationsoverlapping with each other. The vertical axis shows the displacementand displacement speed with the direction of the imaging device 301 sideto be negative. The horizontal axis corresponds to the position in thelengthwise direction of the vibration apparatus 300, similar to FIG.13B.

In the diagrams, waveform C indicates a displacement of the primaryout-of-plane bending vibration. Waveform D indicates a displacement ofthe secondary out-of-plane bending vibration. Waveform E indicatesdisplacement of the vibration apparatus 300 having the two vibrationsoverlapping with each other. Waveform G indicates displacement of thevibration apparatus 300 at a time phase 30° before the waveform E.Waveform F indicates displacement speed that has been normalized by thevibration apparatus 300. In the case that the dust removal apparatus isoperated, the dust that is adhered to the surface of the optical device302 is moved so as to be pulled by force of the normal direction of thesurface of the optical device 302 when the optical device 302 pushes upthe dust towards the out-of-plane direction (the positive direction ofthe vertical axis in FIGS. 14 through 17).

That is to say, in each time phase, when the value of the waveform Findicating displacement speed is positive, the dust is pushed up in theout-of-plane direction, receives force in the normal direction of thewaveform E which indicates the displacement of the vibration apparatus300 in the time phase therein, and the dust is moved. In the case thatthe displacement is provided while the optical device 302 is standing ata defined angle (typically, vertical), in the case that the dust adheredto the surface of the optical device 302 receives force in the normaldirection of the surface of the optical device 302 and drawn, the dustdoes not adhere again, with a constant probability, and falls due togravity.

The arrow h in FIGS. 14 through 17 illustrate the direction that thedust moves. In viewing FIGS. 14 through 17, from position 60 to 300 ofthe optical device 302, the amount of vibration to move the dust in thepositive direction of the horizontal axis is relatively greater than theamount of vibration to move dust in the negative direction. Therefore,the dust may be moved in the positive direction of the horizontal axis.In the case that the effective portion of the optical device 302 as tothe imaging device 301 (also called optical effective portion) is in therange of position 60 through position 300, the dust may be removed fromthe effective portion. Now, in the case that an optical device isdisposed in the light path of the imaging device, the light entering theimaging device means the range which passes through the optical device.

SUMMARY OF THE INVENTION

However, the vibration apparatus described above has problems to beresolved as described below. With the driving apparatus 300 according toJapanese Patent Laid-Open No. 2008-207170, there are a large number ofvibration modes near the resonance frequency of the two vibration modesused for driving. If the vibrations near the resonance frequency isexcited in order to make the vibration modes used for driving to belarger, other unnecessary vibration modes may also respond (also calledexcite or vibrate).

At a joint position having no amplitude in an unnecessary vibration mode(a position that is not displaced), influence from vibrations inunnecessary vibration modes are not received, and may realize afavorable vibration state. However, in other positions, influence fromvibrations in unnecessary vibration modes may be received, whereby theamplitude distribution and phase distribution may be distorted.

Thus, there may be cases wherein a position where the direction of theinner-facing direction, when tapping up (also called pushing up) thedust (driven target) on the front face of the optical device 302,results in an inverse direction, or a position where the components inthe inner-facing direction are small, may occur.

Thus, in the case of a vibration state that differs from the designthereof, depending on the position, there may be cases where the movingdirection of the inner faces are facing one another and so the dustcannot move, or that the movement force is small compared to theadhesive force of the dust and so the efficiency of moving the dust isreduced.

An embodiment provides a vibration apparatus, a driving apparatus havingthe vibration apparatus, a dust removing device, and an optical device,which may efficiently move a driving target, including dust, in apredetermined direction, but using a driving method that considers thevibration response of unnecessary vibration modes.

An embodiment relates to a vibrating body comprising anelectromechanical energy converting element having an electrode, theelectromechanical energy converting element comprising a piezoelectricmaterial having a lead content of less than 1000 ppm; and a control unitthat generates a combined vibration by generating multiple stable waveshaving mutually different orders with a time phase difference byapplying at least two driving voltages to the electromechanical energyconverting element; wherein the control unit changes at least one of thevoltage amplitude ratio and time phase difference of at least the twodriving voltages, so as to change the amplitude distribution of thecombined vibration.

Further features of the disclosure will become apparent from thefollowing description of exemplary embodiments with reference to theattached drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram of a camera.

FIG. 2 is a diagram of a vibration apparatus.

FIG. 3A is a perspective diagram of a distorted shape of an opticaldevice in a first vibration mode, and FIG. 3B is a perspective diagramof a distorted shape of an optical device in a second vibration mode.

FIG. 4 is a diagram illustrating the correlation between nodal lines ofthe first vibration mode and second vibration mode, and the disposal andelectrode patterns of the piezoelectric elements.

FIG. 5A is a diagram illustrating the vibration exciting voltagefrequency and the response gain of vibrations in each vibration mode foreach unit of voltage. FIG. 5B is a diagram illustrating the vibrationexciting voltage frequency and the response phase of vibrations in eachvibration mode.

FIG. 6A-1 is a perspective diagram of a distorted shape of an opticaldevice in a third vibration mode, and FIG. 6A-2 is a diagram seen from afirst direction A. Also, FIG. 6B-1 is a perspective diagram of adistorted shape of an optical device in a fourth vibration mode, andFIG. 6B-2 is a diagram seen from the first direction A.

FIG. 7A is a diagram illustrating the correlation between ranges thatdefine regions, regions, and settings for alternating voltages. Also,FIG. 7B is a perspective diagram of a distorted shape of an opticaldevice in the third vibration mode, and FIG. 7C is a diagram seen fromthe first direction A and illustrates the disposal of regions.

FIG. 8 is a diagram illustrating the values of vibration response of thevibrations in the first through fourth vibration modes used to calculatethe settings of each alternating voltage.

FIG. 9A is a diagram illustrating values of a vibration response oftenth order and eleventh order vibrations used for the settings of eachalternating voltage. Also, FIG. 9B is a diagram illustrating the sizeand phase of vibrating voltage, and FIG. 9C is a diagram illustratingthe size and phase of alternative voltages and the voltage amplituderatios and time phase differences thereof.

FIG. 10 is a diagram illustrating the values of response of thevibrations of the first through fourth vibration modes used incalculating vibrating states at region borders.

FIG. 11 is a diagram illustrating the values of response of thevibrations of the tenth order and eleventh order vibrations used incalculating vibrating states at region borders.

FIG. 12A is a diagram illustrating vibrating states at region borders.FIG. 12B is a diagram illustrating the values of amplitude ratios andtime phase differences of the tenth order and eleventh order vibrationsin vibrating states.

FIG. 13A is a diagram illustrating a configuration of a prior artvibrating apparatus, and FIG. 13B is a diagram illustrating thedisplacement distribution of the out-of-plane primary bending vibrationand out-of-plane secondary bending vibration of the vibrating body ofthe prior art vibrating apparatus, and the disposal of the piezoelectricelements.

FIG. 14 is a graph illustrating, for each time phase, the out-of-planeprimary bending vibration and out-of-plane secondary bending vibrationin the case that the temporal phase difference of the two vibrations is90°, and the displacement of the vibrating bodies where these vibrationsoverlap with each other.

FIG. 15 is a graph illustrating, for each time phase, the out-of-planeprimary bending vibration and out-of-plane secondary bending vibrationin the case that the temporal phase difference of the two vibrations is90°, and the displacement of the vibrating bodies where these vibrationsoverlap with each other.

FIG. 16 is a graph illustrating, for each time phase, the out-of-planeprimary bending vibration and out-of-plane secondary bending vibrationin the case that the temporal phase difference of the two vibrations is90°, and the displacement of the vibrating bodies where these vibrationsoverlap with each other.

FIG. 17 is a graph illustrating, for each time phase, the out-of-planeprimary bending vibration and out-of-plane secondary bending vibrationin the case that the temporal phase difference of the two vibrations is90°, and the displacement of the vibrating bodies where these vibrationsoverlap with each other.

DESCRIPTION OF THE EMBODIMENTS

An embodiment is related to a vibration apparatus, where at least twodriving voltages are set so as to take into consideration the vibrationresponses in unnecessary vibration modes as described above, and wherechanges are made to at least one of the voltage amplitude ratio and timephase difference of the driving voltages.

With the present embodiment, the term “vibrating body” refers to anintegrated unit made of joining an optical element which is an elasticbody and a piezoelectric element by an adhesive material.

An embodiment provides a vibration apparatus having a configurationdescribed below, and a driving apparatus and dust removing device andoptical device having the vibration apparatus. Examples of theembodiments will be further described below, but the disclosure is notto be limited by these.

First Embodiment

FIG. 1 is a camera which is an optical device. The numeral 11 denotes acamera main unit, and the numeral 12 denotes a lens housing.

A configuration example of a vibration apparatus installed on a cameraaccording to a first embodiment will be described with reference to FIG.2.

The vibration apparatus according to the present embodiment functions asa dust removing device that moves and removes the dust. Also, the dustremoving device is disposed on the light path of the optical device.

In FIG. 2, reference numeral 1 denotes an optical element, to whichpiezoelectric elements 2 (2 a and 2 b) which are two electromechanicalenergy conversion devices are fixed by an adhesive on the same side asthe imaging device 4. However, the number of piezoelectric elements isnot limited to two; at least one is needed. In the case of onepiezoelectric element, an individual electrode is provided on thepiezoelectric element thereof, and different driving voltages may beapplied to each electrode. Also, the piezoelectric element according tothe present embodiment has piezoelectric material of which the amount oflead contained is less than 1000 ppm, and an electrode. Details of thepiezoelectric material will be described later.

A control circuit 100 sets the frequency, voltage value, and time phaseof the alternating voltage serving as the driving voltage emitting froma power source 101. The power source 101 is electrically connected tothe piezoelectric elements 2 a and 2 b. A control unit 1000 is made upof the control circuit 100 and power source 101. According to thepresent embodiment, there may be at least two driving voltages.

A vibrating body 3 is made up of the optical element 1 and piezoelectricelements 2. The vibrating body 3 is attached to an imaging device 4 sothat the space at the front face of the imaging device 4 which is alight-receiving device is sealed off. The light from the subject passesthrough the optical device 1, and enters the imaging device 4. The rangewhere the light entering the imaging device at this time transmits theoptical device 1 is an optical effective unit 5.

According to the present embodiment, two out-of-plane bending vibrations(standing waves) having different orders, of which nodal lines arearrayed in the same direction, are provided with a time phase differenceand excited, whereby a combined vibration of two out-of-plane bendingvibrations having been combined is generated. The nodal lines refer tovirtual lines that are formed in the event that portions serving asconnections of the standing wave are connected in the case thatvibrations are applied to a predetermined face of a vibration targetwhich is an elastic body (e.g., optical device), and a standing wave isgenerated on the face of the vibration target.

According to the present embodiment, the control circuit 100 sets thefrequency of the driving voltage generated by the power source 101 sothat nodal lines are arrayed in the left/right direction on the paper(first direction, A in the diagrams) and responses are made to both theout-of-plane tenth order bending vibration mode (first vibration mode)and out-of-plane eleventh order vibration mode (second vibration mode),and both responses have approximately the same frequency. Now,“responses are made” means that the vibration is excited or that avibration occurs.

FIG. 3A is a perspective diagram of a distorted shape the an opticaldevice 1 in the first vibration mode, and FIG. 3B is a perspectivediagram of a distorted shape of the optical device 1 in the secondvibration mode. In FIGS. 3A and 3B, A denotes a first direction and Bdenotes a second direction which intersects with the first direction.

According to the present embodiment, the first direction A and seconddirection B are orthogonal to one another. C denotes a nodal line in avibration mode. The first vibration mode and second vibration mode havemultiple nodal lines that are arrayed in the first direction A. Also,the number of nodal lines arrayed in the first direction A is 11 in thefirst vibration mode and 12 in the second vibration mode, differing fromone another. The first vibration mode has fewer orders of out-of-planebending distortions than the second vibration mode, and the wavelengthis longer, whereby the number of unique vibrations is less than in thesecond vibration mode.

The control circuit 100 sets the time phase difference of two drivingvoltages that are generated by the power source 101. Thus, theout-of-plane tenth order bending vibration mode (first vibration mode)and out-of-plane eleventh order vibration mode (second vibration mode)are generated to the vibrating body 3 at different time phases.

Regarding the combined vibrations herein, the directions of theout-of-plane direction at the time of pushing up the driven target suchas dust are approximately the same in almost all of the regions on thesurface of the optical device 1. Therefore, force may be applied in onedirection within the plane of all of the driven targets that are movedby the vibrations, whereby movement in one direction may be realized.

Correlation between nodal lines of the out-of-plane tenth order bendingvibration mode (first vibration mode) and out-of-plane eleventh ordervibration mode (second vibration mode), and the disposal and electrodepatterns of each piezoelectric element 2, will be described withreference to FIG. 4.

Plot 6 illustrates the displacement distribution of the first vibrationmode excited in the vibrating body 3 (denoted by 7 in the diagram) andthe displacement distribution of the second vibration mode (denoted by 8in the diagram). The vertical axis represents displacement in theout-of-plane direction of the optical device 1, and the opposite sidefrom the side where the imaging device 4 is disposed is positive. Thehorizontal axis corresponds to the position in the left/right directionof the optical device 1 in the diagram. Also, according to the presentembodiment, a neutral plane in the bending of the two vibrations iswithin the optical device 1.

Expanding/contracting distortions occur in the left/right direction inthe piezoelectric element 2 which is disposed at a positive location ofthe displacement, and expanding/contracting distortions occur in theleft/right direction of the opposite phase (180°) in the piezoelectricelement 2 which is disposed at a negative location of the displacement.The piezoelectric elements 2 a and 2 b on both left and right ends arein a rectangular plate shape, and are disposed from the end of theoptical device 1 to the optical effective range 5 in the left/rightdirection (first direction A), and are disposed up to both ends of theoptical device 1 in the up/down direction (second direction B).

The piezoelectric elements 2 a and 2 b have uniform electrodes over theentire back face that is joined to the optical device 1, and haveelectrodes that are divided into multiple electrodes (hereinafter,divided electrodes 9) on the front face of the opposite face.

The divided locations of the divided electrodes 9, as the correlation isillustrated in the diagram by broken lines, are at positions between alocation of a joint where the displacement in the displacementdistribution 7 in the first vibration mode is roughly 0, and a locationof a joint where the displacement in the displacement distribution 8 inthe second vibration mode is roughly 0.

At the time of the electrode dividing, the electrode on the back face isthe grounding potential, and potential of a different polarity from theadjoining electrode is applied to the divided electrode 9 on the frontface as illustrated by + and − in the diagram. The divided electrode ofthe piezoelectric element 2 a on the left is given polarity of + − + −from the left end, and the piezoelectric element 2 b on the right isgiven polarity of + − + − from the right end. The dividing direction isthe thickness direction of the piezoelectric element 2, and is theorthogonal direction on paper in FIG. 4.

After the electrode dividing, a conductive coating 10 havingconductivity is provided so as to cross over the divided electrode 9,and voltage is applied to one of the locations of the divided electrode9, whereby all of the divided electrodes 9 of one piezoelectric element2 will have the same potential.

The piezoelectric element 2 has a feature which, upon polarity of thesame potential as the polarity of the potential at time of the electrodedividing being provided, a force is generated that stretches in theorthogonal direction as to the electrode dividing direction, and shrinkswhen a different polarity from the polarity at the time of electrodedividing is provided. In the event that alternating voltage is applied,cyclic stretching force that matches the cycle of the alternatingvoltage is generated. Also, according to the polarity at the time ofelectrode dividing, the phase (0° or 180°) of stretching force as to thealternating voltage is determined.

The driving voltage E(1)=V(1)×COS(2πft) which is the alternating voltageis applied to the piezoelectric element 2 a on the left. The drivingvoltage E(1) is a first driving voltage according to the presentembodiment, where V(1) represents the size (amplitude) of the voltage, frepresents frequency, and t represents time. The driving voltageE(2)=V(2)×COS(2πft+δ×π/180), which is the alternating voltage in whichthe time phase differs by δ in order increments, is applied to thepiezoelectric element 2 b on the right. The driving voltage E(2) is asecond driving voltage according to the present embodiment, where V(2)represents the size (amplitude) of the voltage.

At this time, the voltage that is primarily provided to the out-of-planetenth order bending vibration mode (first vibration mode 7) in which thepiezoelectric elements 2 a and 2 b have opposite phases is theE(difference) where the components of the difference between the drivingvoltages E(1) and E(2) are divided into the piezoelectric elements 2 aand 2 b on the left and right, which is defined asE(difference)=E(1)/2−E(2)/2.

On the other hand, the voltage that is primarily provided to theout-of-plane eleventh order bending vibration mode (second vibrationmode 8) in which the piezoelectric elements 2 a and 2 b have the samephase is the E(sum) where the components of the sum of the drivingvoltages E(1) and E(2) are divided into the piezoelectric elements 2 aand 2 b on the left and right, which is defined as E(sum)=E(1)/2+E(2)/2.

Now, the phase of the stretching force that is generated by thepiezoelectric element 2 from the E(difference) will be described, withE(difference) as the phase standard. The distribution of the phases ofthe stretching force of the piezoelectric element 2 a on the left is 0°,180°, 0°, 180° from the left end, corresponding to the divided electrode9. The piezoelectric element 2 b on the right is 180°, 0°, 180°, 0° fromthe right end. The distribution of the phases of stretching force hereinroughly matches the distribution of the phases of stretching distortionof the piezoelectric element 2 from the distortion distribution 7 of theout-of-plane tenth order bending vibration mode (first vibration mode).Therefore, large vibrations may be obtained from the out-of-plane tenthorder bending vibration mode (first vibration mode).

On the other hand, the distribution of phases of the stretching forceroughly matches the displacement distribution 8 of the out-of-planeeleventh order bending vibration mode (second vibration mode), withpiezoelectric element 2 a on the left, and is roughly inverse with thepiezoelectric element 2 b on the right. With the out-of-plane eleventhorder bending vibration mode (second vibration mode) from theE(difference), the vibrations excited by the piezoelectric element 2 aon the left and the vibrations excited by the piezoelectric element 2 bon the right are the same size and opposite phases, whereby these canceleach other out and the size becomes roughly zero. Therefore, vibrationsin the out-of-plane eleventh order bending vibration mode (secondvibration mode) do not occur in E(difference). Also, with anothervibration mode having a different number of joints in the left/rightdirection from the out-of-plane tenth order bending vibration mode(first vibration mode), the distortion phase distribution differs fromthe phase distribution of the stretching force, and by the vibrationcancelling-out effect, vibrations may be reduced.

Next, the phase of the stretching force that is generated by thepiezoelectric element 2 from the E(sum) will be described, with E(sum)as the phase standard. The distribution of the phases of the stretchingforce of the piezoelectric element 2 a on the left is 0°, 180°, 0°, 180°from the left end, corresponding to the divided electrode 9. Similarly,the piezoelectric element 2 b on the right is 0°, 180°, 0°, 180° fromthe right end.

The distribution of the phases of stretching force herein roughlymatches the distribution of the phases of stretching distortion of thepiezoelectric element 2 from the distortion distribution 8 of theout-of-plane eleventh order bending vibration mode (second vibrationmode). Therefore, large vibrations may be obtained from the out-of-planeeleventh order bending vibration mode (second vibration mode).

The distribution of phases of the stretching force roughly matches thedisplacement distribution 7 of the out-of-plane tenth order bendingvibration mode (first vibration mode), with piezoelectric element 2 a onthe left, and is roughly inverse with the piezoelectric element 2 b onthe right. With the out-of-plane tenth order bending vibration mode(first vibration mode) from the E(sum), the vibrations excited by thepiezoelectric element 2 a on the left and the vibrations excited by thepiezoelectric element 2 b on the right are the same size and oppositephases, whereby these cancel each other out and the size becomes roughlyzero. Therefore, vibrations in the out-of-plane tenth order bendingvibration mode (first vibration mode) do not occur in E(sum). Also, withanother vibration mode having a different number of joints in theleft/right direction from the out-of-plane eleventh order bendingvibration mode (second vibration mode), the distortion phasedistribution differs from the phase distribution of the stretchingforce, and by the vibration cancelling-out effect, vibrations may bereduced.

Now, the relation between the vibrations in the first vibration mode andvibrations in the second vibration mode and the driving voltage E(1) anddriving voltage E(2) will be described again, in addition to theabove-described vibration exciting voltage E(difference) and vibrationexciting voltage E(sum), with consideration of vibration responses(response amplitude gain and response phase).

Let us say that the response amplitude gain of the vibration response inthe first vibration mode as to the vibration exciting voltageE(difference) is α(1), and the response phase is β(1). Similarly, let ussay that the response amplitude gain of the vibration response in thesecond vibration mode as to the vibration exciting voltage E(sum) isα(2), and the response phase is β(2). The response amplitude gains α(1)and α(2) are values computed at locations having the maximumdisplacement within the displacement distribution of the first andsecond vibration modes illustrated in FIG. 4. The locations of themaximum amplitude herein are one location for each wavelength, and atthese positions have the same amplitude values.

The distribution of response phases in each vibration mode has a fixedvalue at locations where the displacement is positive. Also,distribution of response phases in each vibration mode has a fixed valueat locations where the displacement is negative, and has an inversephase that differs by 180° as to the response phase of the positivelocations. The response phases β(1) and β(2) are values that theresponse phases are computed at locations where the displacement ispositive.

α(1), α(2), β(1), and β(2) are measured using a laser Doppler vibrationgauge or the like, and become known numbers. Also, now, the sizes of thedriving voltage E(1), driving voltage E(2), vibration exciting voltageE(difference), and vibration exciting voltage E(sum) are denoted, inorder, as V(1), V(2), V(difference), and V(sum), and the time phases aredenoted in order, as θ(1), θ(2), θ(difference), and θ(sum).

For the vibrations in the first vibration mode, V (difference) andθ(difference) for size X(1) and time phase φ(1) are found as inExpressions (1) and (2) below. The size X(1) is the value of theamplitude at the location of maximum displacement within thedisplacement distribution in the first vibration mode. The time phaseφ(1) is the value of the response phase at a location where thedisplacement is positive.

V(difference)=X(1)/α(1)  Expression (1)

θ(difference)=φ(1)−β(1)  Expression (2)

Similarly, for the vibrations in the second vibration mode, the V(sum)and θ(sum) for size X(2) and time phase φ(2) are found as in Expressions(3) and (4) below. The size X(2) is the value of the amplitude at thelocation of maximum displacement within the displacement distribution inthe second vibration mode. The time phase φ(2) is the value of theresponse phase at a location where the displacement is positive.

V(sum)=X(2)/α(2)  Expression (3)

θ(sum)=φ(2)−β(2)  Expression (4)

Also, the driving voltage E(1) is the result of E(difference) added toE(sum), and E(2) is the result of E(difference) subtracted from E(sum),and V(1), θ(1), V(2), and θ(2) may be found as in Expressions (5)through (8) below.

V(1)=[{V(sum)×cos θ(sum)+V(difference)×cos θ(difference)}² +{V(sum)×sinθ(sum)+V(difference)×sin θ(difference)}²]^(0.5)  Expression (5)

θ(1)=TAN⁻¹ [{V(sum)×sin θ(sum)+V(difference)×sinθ(difference)}/{V(sum)×cos θ(sum)+V(difference)×cosθ(difference)}]  Expression (6)

V(2)=[{V(sum)×cos θ(sum)−V(difference)×cos θ(difference)}² +{V(sum)×sinθ(sum)−V(difference)×sin θ(difference)}²]^(0.5)  Expression (7)

θ(2)=TAN⁻¹ [{V(sum)×sin θ(sum)−V(difference)×sinθ(difference)}/{V(sum)×cos θ(sum)−V(difference)×cosθ(difference)}]  Expression (8)

According to the present embodiment, in order to more effectively movedust or the like (all objects that may be moved by vibration), thevibrations of the first vibration mode and the vibrations of the secondvibration mode may be the same size, and the time phase difference maybe 90°. That is to say, the conditions are X(1)=X(2)=X(0),φ(1)−φ(2)=90°. X(0) is the size of amplitude to be set beforehand,considering the moving state of the object to be moved. V(1), V(2),θ(1), and θ(2) which satisfy these conditions may be found usingExpressions (1) through (8).

In order to multiply X(0) by γ times, V(1) and V(2) may be both made γtimes larger, and the voltage amplitude ratio ∈=V(2)/V(1) of the V(1)and V(2) does not change. Also, if θ(1) is used as the time phasestandard, the time phase difference δ becomes δ=θ(2)−θ(1). That is tosay, in order to more effectively move dust or the like, the voltageamplitude ratio ∈ and time phase difference δ may be computed usingExpressions (1) through (8), Expression (9) which is X(1)=X(2), andExpression (10) which is φ(1)−φ(2)=90°.

Now, in order to heighten understanding of the present embodiment,details of the problems in the above-described technology (JapanesePatent Laid-Open No. 2008-207170) will be described further. FIG. 5A isa graph expressing the vibration exciting voltage frequency and theresponse gain of vibrations in each vibration mode for each unit ofvoltage (1 V). FIG. 5B is a graph expressing the vibration excitingvoltage frequency and the response phase of vibrations in each vibrationmode.

In FIG. 5A, plot D indicates the response gain α(1) of the vibrations inthe first vibration mode in the case that the vibration exciting voltageE(difference), which is the alternating voltage described above, is aunit voltage (1 V). Also, plot E indicates the response gain α(2) of thevibrations in the second vibration mode in the case that the vibrationexciting voltage E(sum), which is the alternating voltage, is a unitvoltage (1 V). In FIG. 5B, plot D indicates the response phase β(1) ofthe vibrations in the first vibration mode as to E(difference), and plotE indicates the response phase β(2) of the vibrations in the secondvibration mode as to E(sum).

Many other vibration modes also exist in the vibrating body 3, near theunique vibration numbers of the vibration modes (plots F, G, and H inFIG. 5A).

The vibration modes herein have difference displacement distributionsfrom the first vibration mode D and second vibration mode E, and arevibration modes that change the amplitude distribution and phasedistribution of the generated vibrations.

The vibration mode of plot F in FIG. 5A has a bending order in theleft/right direction (first direction A) that is an out-of-plane tenthorder bending deformation, similar to the first vibration mode D, and isa vibration mode (third vibration mode) that becomes an out-of-planeprimary deformation in the up/down direction (second direction B). Thethird vibration mode has a maximum value of the response gain in thecenter portion in the up/down direction (second direction B) and theupper/lower end portions, and F indicates the size of response gain inthe case that the maximum value E(difference) is a unit voltage (1 V).The plot F in FIG. 5B indicates a response phase of the vibrations inthe third vibration mode as to the E(difference).

FIG. 6A-1 is a perspective diagram of a distorted shape of an opticaldevice 1 in the third vibration mode F, and FIG. 6A-2 is a diagram seenfrom the first direction A.

The distorted shape in the third vibration mode F is distorted in theup/down direction (second direction B) in addition to the distortedshape in the first vibration mode D. Therefore, the third vibration modehas a somewhat higher number of unique vibrations than does the firstvibration mode D.

Even among unnecessary vibration modes, the vibrations in the thirdvibration mode F are particularly large. The reason that the vibrationsin the third vibration mode F are particularly large will be describednow.

In order to generate vibrations in the first vibration mode D andvibrations in the second vibration mode E, a driving voltage is appliedto the piezoelectric elements 2 a and 2 b, stretching force in theleft/right direction (first direction A) is generated, and bendingdeformation force in the direction of the vibrating body 3 is generated.As described above, the dividing positions of the dividing electrode 9are approaching the positions of nodal lines in the first vibration modeD and second vibration mode E.

On the other hand, in the third vibration mode F also, the phasedistribution of stretching deformation in the first direction A isapproaching the phase distribution of the stretching force generated bythe piezoelectric element 2. Therefore, vibrations in the thirdvibration mode F become larger. Further, in the piezoelectric element 2,the up/down direction (second direction B) is the direction that isorthogonal to the polarization direction, and stretching force isgenerated in this direction also, whereby bending deformation force isgenerated as to the vibrating body 3.

The third vibration mode F is a vibration mode having bendingdeformation in the up/down direction (second direction B). Thus, thevibrations in the third vibration mode F become even larger. Similarly,the bending order in the left/right direction (first direction A)indicating the size of vibrations in G in FIGS. 5A and 5B becomes theout-of-plane eleventh order bending deformation which is the same as inthe second vibration mode, and the vibrations in the vibration mode thathave out-of-plane primary bending deformation in the up/down direction(second direction B) (fourth vibration mode) also are particularlylarge. The fourth vibration mode has a maximum value of the responsegain in the center portion in the up/down direction (second direction B)and the upper/lower end portions, and G indicates the size of responsegain in the case that the maximum value E(sum) of this response gain isa unit voltage (1 V). The plot G in FIG. 5B indicates a response phaseof the vibrations in the fourth vibration mode as to the E(sum).

FIG. 6B-1 is a perspective diagram of a distorted shape of an opticaldevice 1 in the fourth vibration mode G, and FIG. 6B-2 is a diagram seenfrom the first direction A. The distorted shape in the fourth vibrationmode G is distorted in the up/down direction (second direction B) inaddition to the distorted shape in the second vibration mode E.Therefore, the fourth vibration mode G has a somewhat higher number ofunique vibrations than does the second vibration mode E.

The third vibration mode F and fourth vibration mode G have differentdisplacement distributions in the up/down direction (second direction B)from the first vibration mode D and second vibration mode E, which areexcited in order to move dust. Therefore, when the vibrations of thethird vibration mode F and fourth vibration mode G are large, theamplitude distribution and phase distributions of the vibrations inorder to move dust or the like may change. Also, locations where thedust does not move and locations having a small amount of movement mayarise, whereby the effectiveness of moving dust is decreased.

Now, adding the responses of the vibrations of the third vibration modeand vibrations of the fourth vibration mode which become particularlylarge, the responses of the amplitude distribution and phasedistribution will be described. The location of nodal line C in FIGS.6A-1 and 6B-1 is a location where the amplitudes of the third and fourthvibration modes are zero, and therefore does not receive any influencefrom the vibrations of the third vibration mode and vibrations of thefourth vibration mode. However, other locations have amplitudes, theinfluence of which is received.

The displacement distribution in the left/right direction (firstdirection A) of the first vibration mode and third vibration mode bothhave out-of-plane tenth order bending. The vibrations combined by thevibrations in these vibration modes are called tenth order vibrations.Let us say that the size thereof is X(10, b) and the time phase is φ(10,b). Further, for the third vibration mode, let us say that the responseamplitude gain is α(3, b) and the response phase is β(3, b). The thirdvibration mode has distributions of response amplitude and responsephase, in the second direction B. The b within the parentheses is at aposition in the second direction, where α(3, b) and β(3, b) arefunctions of the position b. Accordingly, since the tenth ordervibrations also have distributions of response amplitude and responsephase, in the second direction B, X(10, b) and φ(10, b) similarly arefunctions of the position of the b within parentheses in the seconddirection.

The response amplitude gain α(3, b) is a value computed from the maximumdisplacement location within the displacement distribution of theposition b in the third vibration mode. The maximum displacementlocation herein is one location for each wavelength in the firstdirection A, and at these positions have the same amplitude value. Thedistribution of response phases in the third vibration mode a fixedvalued at the locations where the displacement within the same positionb is a positive location. Also, at a location where the displacement isnegative, the fixed value is of an inverse phase different by 180° as tothe response phase at a positive location. The response phase β(3, b) isa value of which the response phase is computed, where the displacementis at a positive location at position b. Also, the vibrations of thefirst vibration mode and the vibrations of the third vibration mode havea response amplitude gain as to the E(difference) of α(10, b) and theresponse phase of β(10, b), of the combined vibration. These becomefunctions of the position b in the second direction.

α(10, b) and β(10, b) are measured using a laser Doppler vibration gaugeor the like in the state of applying just the E(difference), and becomeknown numbers. Also, by performing mode analysis in numerical analysisusing a finite element method, a joint position may be identified havinga response gain of zero in the third vibration mode. At this jointposition, there is no influence from the third vibration mode, wherebyaccording to the above-described measurement, the response amplitudegain α(1) and response phase β(1) of the vibrations in the firstvibration mode may be measured with the above-described measurement. Thefirst vibration mode has the same response to the second direction B.α(1) and β(1) may be subjected to mathematical vector analysis from themeasured α(10, b) and β(10, b), whereby α(3, b) and β(3, b) may becomeknown values.

The size X(10, b) and the time phase φ(10, b) of the tenth ordervibrations are expressed in the Expressions (11) through (14) below.

X(10,b)=α(10,b)×V(difference)  Expression (11)

α(10,b)=[{α(1)×sin θ(1)+α(3,b)×sin θ(3,b)}²+{α(1)×cos θ(1)+α(3,b)×cosθ(3,b)}²]^(0.5)  Expression (12)

φ(10,b)=β(10,b)+θ(difference)  Expression (13)

β(10,b)=tan⁻¹[{α(1)×sin θ(1)+α(3,b)×sin θ(3,b)}/{α(1)×cosθ(1)+α(3,b)×cos θ(3,b)}]  Expression (14)

Similarly, the displacement distribution in the left/right direction(first direction A) of the second vibration mode and fourth vibrationmode both have out-of-plane eleventh order bending. The vibrationscombined by the vibrations in these vibration modes are called eleventhorder vibrations. Let us say that the size thereof is X(11, b) and thetime phase is φ(11, b). Further, for the fourth vibration mode, let ussay that the response amplitude gain is α(4, b) and the response phaseis β(4, b). The fourth vibration mode and eleventh order vibrations alsohave distributions of response amplitude and response phase, in thesecond direction B. The b within the parentheses is at a position in thesecond direction, where α(4, b) and β(4, b), and X(11, b) and φ(11, b)are functions of the position b. The definitions of α(4, b) and β(4, b),and α(11, b) and β(11, b) are similar to the α(3, b) and β(3, b), andα(10, b) and β(10, b) described above. α(2), β(2), α(4, b), β(4, b),α(11, b), and β(11, b) may become known values by using measurements bya laser Doppler vibration gauge while in the state of applying justE(sum), mode analysis results and vector analysis or the like.

The size X(11, b) and the time phase φ(11, b) of the eleventh ordervibrations are expressed in the Expressions (15) through (18) below.

X(11,b)=α(11,b)×V(sum)  Expression (15)

α(11,b)=[{α(2)×sin θ(2)+α(4,b)×sin θ(4,b)}²+{α(2)×cos θ(2)+α(4,b)×cosθ(4,b)}²]^(0.5)  Expression (16)

φ(11,b)=β(11,b)+θ(sum)  Expression (17)

β(11,b)=tan⁻¹[{α(2)×sin θ(2)+α(4,b)×sin θ(4,b)}/{α(2)×cosθ(2)+α(4,b)×cos θ(4,b)}]  Expression (18)

Similar to the case of considering just the first and second vibrationmodes as described above, in order to more effectively move dust or thelike, the voltage amplitude ratio ∈ and time phase difference δ of E(1)and E(2) may be computed and set from the Expressions (11) through (18),Expressions (5) through (8), Expression (19) of X(0)=X(10, b)=X(11, b),and Expression (20) of φ(10, b)−φ(11, b)=90°. X(0) is the size ofamplitude to be set beforehand, considering the moving state of theobject to be moved.

According to the related art (Japanese Patent Laid-Open No.2008-207170), driving voltage to be applied is set, considering just thevibrations of the two vibration modes that primarily are excited(similar to the first and second vibration modes according to thepresent embodiment). However, while responses occur in other vibrationmodes, these have not been considered. Modifying the voltage settings inorder to switch the direction of movement is described, but if themovement direction is the same, the combination of two driving voltagesbecomes one setting. That is to say, if the movement direction is thesame, the time phase difference of the two driving voltages will have anidentified combination. It goes without saying that the voltageamplifying ratio of the two driving voltages will also have anidentified combination. Therefore, the proximity of locations where theamplitudes are nodal lines of zero for both the third and fourthvibration modes become the optimal vibration state, and other locationsmay lose capability to move dust. That is to say, the amplitudedistribution of the combined vibration occurring in the vibration bodydoes not change and becomes constant.

The present embodiment takes into consideration responses of vibrationsin unnecessary vibration modes such as the third and fourth vibrationmodes, and enables moving dust or the like in a wider range and withgreater efficiency.

Now, the vibration response, driving method, and the advantage thereofaccording to the present embodiment will be described. In the case thatE(difference) and E(sum) are the same size in the frequencies of thedriving voltages E(1) and E(2), the frequency is such that the size ofvibrations in the first and second vibration modes is the same, and isdenoted by f in FIG. 5A. When the frequency of E(1) and E(2) is f, thefrequency of E(difference) and E(sum) is also f.

In the frequency f, the maximum value F of the size of vibrations in thethird vibration mode is half the size of vibrations in the first andsecond vibration modes. Also, the maximum value G of the size ofvibrations in the fourth vibration mode is one-fourth the size ofvibrations in the first and second vibration modes.

If the size of these vibrations are normalized by the size of vibrationsof the first vibration mode, the maximum value of α(1)=1, α(2)=1, α(3,b) is 0.5, and the maximum value of α(4, b) is 0.25.

Also, the response phase β(1) in the first vibration mode D as to theE(difference) is −165°, and the response phase β(2) in the secondvibration mode E as to the E(sum) is −15°. The response phase β(3, b) inthe third vibration mode F as to the E(difference) is −157° in a regionsandwiched between two nodal lines C that are parallel to the firstdirection A in FIG. 6A-1, and is an inverted 23° on the outer sidethereof.

The response phase β(4, b) in the fourth vibration mode G as to theE(sum) is −12° in a region sandwiched between two nodal lines C that areparallel to the first direction A in FIG. 6B-1, and is an inverted 168°on the outer side thereof.

Now, specific voltage settings and vibration state based on the relatedart will be described. The Expressions (1) through (10), the values α(1)and α(2), and the values β(1) and β(2) are used to compute the voltageamplitude ratio ∈ and the time phase difference δ of the voltagesettings.

If α(1)=1 is substituted into Expression (1), V(difference)=X(1) holds.If α(2)=1 is substituted into Expression (3), V(sum)=X(2) holds. Fromthese and from Expression (9), V(difference)=V(sum) holds.

If β(1)=−165° is substituted into Expression (2),θ(difference)=φ(1)+165° holds. If β(2)=−15° is substituted intoExpression (4), θ(sum)=φ(2)+15° holds. From these and from Expression(10), θ(difference)−θ(sum)=240° holds. Now, if θ(difference)=0° withθ(difference) as the time phase reference, θ(sum)=−240° holds.

If V(difference)=V(sum) and θ(difference)=0° and θ(sum)=−240° aresubstituted into Expressions (5) through (8) and calculated, thenV(1)=V(difference), V(2)=1.732×V(difference), θ(1)=60°, and θ(2)=150°hold. Thus, the voltage amplitude ratio ∈=V(2)/V(1)=1.732 and time phasedifference δ=90° are set. From the voltage amplitude ratio ∈ and timephase difference δ, the vibrations of the first vibration mode and thevibrations of the second vibration mode will be the same size, and willbe in a vibration state of a 90° time phase difference. For example, ifthe amplitude X(0) to be set is 100, then the voltage setting isV(1)=100, V(2)=173.2, and the time phase difference δ of E(2) as to E(1)is 90°, and the vibration state becomes X(0)=X(1)=X(2)=100,φ(1)−φ(2)=90°.

However, as described above, since there are influences from thevibrations in the third and fourth vibration modes, other than atpositions of the nodal lines of the vibrations in the third and fourthvibration modes, the tenth order vibrations and eleventh ordervibrations are the same size, and disappear in the state of a 90° timephase difference.

Now, as an example, the responses of the tenth order vibrations andeleventh order vibrations at the central portion in the up/downdirection (second direction B) and the upper and lower ends, at the samevoltage settings, will be described.

The responses of the tenth order vibrations and eleventh ordervibrations at the central portion in the up/down direction (seconddirection B) are obtained from the Expressions (11) through (14), fromthe above-described V(difference)=V(sum) and θ(difference)=0° andθ(sum)=−240°, and from α(3, b)=0.5 and β(3, b)=−165° and α(4, b)=0.25and β(4, b)=−12°. Thus, X(10, b)=150, φ(10, b)=−162°, X(11, b)=125, andφ(11, b)=−254° hold. Thus, X(10, b) and X(11, b) are not the same size,and φ(10, b) and φ(11, b) are not in the same 90° time phase difference,and the capability to move dust is decreased. Also, X(10, b) and X(11,b) greatly differ from the size X(0)=100 which is the amplitude to beset.

Similarly, the responses at the upper and lower ends in the up/downdirection (second direction B) are obtained from the Expressions (11)through (14), from the above-described V(difference)=V(sum) andθ(difference)=0° and θ(sum)=−240°, and from α(3, b)=0.5 and β(3,b)=−165° and α(4, b)=0.25 and β(4, b)=−12°. Thus, X(10, b)=51, φ(10,b)=−173°, X(11, b)=75, and φ(11, b)=−256° hold. Thus, X(10, b) and X(11,b) are not the same size, and φ(10, b) and φ(11, b) are not in the same90° time phase difference, and the capability to move dust is decreased.Also, X(10, b) and X(11, b) greatly differ from the size X(0)=100 whichis the amplitude to be set.

According to the present embodiment, the responses(excitations/vibrations) that are particularly large in the third andfourth vibration modes are taken into account, and the control unitchanges the voltage amplitude ratio ∈ and the time phase difference δ ofthe driving voltages E(1) and E(2). That is to say, the voltageamplitude ratio e and the time phase difference 8 of the drivingvoltages E(1) and E(2) are changed in a time-series manner atpredetermined time units. The responses of the vibrations in the thirdand fourth vibration modes have a distribution in the second directionB, as described above. Taking this into consideration, using theresponse amplitude gain α(3, b) and response phase β(3, b) of thevibrations in the third vibration mode as a threshold, the opticaldevice 1 if virtually dividing into ten region (regions 1 through 10) inthe up/down direction (second direction B), as illustrated in FIG. 7A.FIG. 7B is a perspective diagram of a distorted shape of an opticaldevice 1 in the third vibration mode. FIG. 7C is a diagram seen from thefirst direction A and illustrates the disposal of regions 1 through 10.

The present embodiment is focused on having an optimal alternatingvoltage setting for each of the regions herein, and so as to change theamplitude distribution of the combined vibrations, at least one of thevoltage amplitude ratio and time phase difference of the drivingvoltages is changed. With such a driving voltage, ideally, the regionhaving the optimal vibration state is switched sequentially in atime-series manner, and having all of the regions to experience anoptimal vibration state during one control period may be realized.

The response amplitude gain and response phase distribution in the firstthrough fourth vibration modes each are in a vertically symmetricalrelation. Accordingly, as illustrated in FIG. 7A, the combination ofregions 1 through 10 and the settings of the alternating voltage becomesone pair of regions where the vertically symmetrical regions fromregions 1 through 10 set (apply) the same alternating voltage. Also, thefirst through fifth alternating voltages are set as to the pair ofregions that sets the same alternating voltage. That is to say, “aregion regarding which is set the same alternating voltage” referencesnot necessarily just one physically continuous region, but even if in aphysically separate location, as long as the region sets the samealternating voltage, this may be “a region regarding which is set thesame alternating voltage”. Accordingly, in the case of distinguishing “afirst region to set the same alternating voltage” and “a second regionto set the same alternating voltage”, there may be cases where eachregion is one physically continuous region and there may be cases whereat least one region is a group of physically separated regions. Theregions included in the first region and second region each set the samealternating voltage, and the first region alternating voltage and thesecond region alternating voltage are set with mutually differentalternating voltages.

Also, according to the present embodiment, if at least two regions to beset (virtually divided) exist, the advantages of the present embodimentmay be obtained, but the number of regions to be set (virtually divided)is not limited to two, and depending on the state of the vibrations tobet set, setting (division) may be made into two or more regions. Thatis to say, virtually dividing into a first through n'th region (n is aninteger that is 2 or greater), and computing an optimal alternatingvoltage setting for each region may be performed.

Also, the method of setting (dividing) each region is determinedappropriately based on the state of the vibrations to be set and theshape of the vibration target. For example, if the vibration target isrectangular, the regions may be set (divided) in multiple lines in thedirection orthogonal to the lengthwise direction of the vibrationtarget. Similarly, the regions may be set (divided) in multiple lines inthe direction parallel to the lengthwise direction of the vibrationtarget. Also, the regions may be set (divided) in multiple lines in agrid form, in the direction orthogonal to the lengthwise direction andin the direction parallel to the lengthwise direction of the vibrationtarget. If the vibration target is round-shaped, multiple regions may beset in lines, similar to the rectangular vibration target, but multipleregions may also be set in concentric circles.

According to the present embodiment, the regions 5 and 6 together serveas a first region regarding which is set a first alternating voltagewhich is the same alternating voltage. Similarly, the regions 4 and 7together serve as a second region regarding which is set a secondalternating voltage which is the same alternating voltage. Similarly,the regions 3 and 8 together serve as a third region regarding which isset a third alternating voltage which is the same alternating voltage.Similarly, the regions 2 and 9 together serve as a fourth regionregarding which is set a fourth alternating voltage which is the samealternating voltage. Similarly, the regions 1 and 10 together serve as afifth region regarding which is set a fifth alternating voltage which isthe same alternating voltage. The first through fifth alternatingvoltages mutually differ in at least one value of the voltage amplituderatio and time phase difference.

The control device according to the present embodiment has an optimalalternating voltage set for each of the first through fifth regions, andan optimal vibrating state is sequentially realized for the firstthrough the fifth region. The regions and the alternating voltagesettings correspond as illustrated in FIG. 7A. The first alternatingvoltage has settings as described above in order for the first region tobe in an optimal vibrating state. The second alternating voltage hassettings in order for the second region to be in an optimal vibratingstate. The third alternating voltage has settings in order for the thirdregion to be in an optimal vibrating state. The fourth alternatingvoltage has settings in order for the fourth region to be in an optimalvibrating state. The fifth alternating voltage has settings in order forthe fifth region to be in an optimal vibrating state. Now, theexpression above of “the first alternating voltage has settings” refersto an alternating voltage “combination” which is applied, in the casethere are two piezoelectric elements, to each of the first and secondpiezoelectric elements in order to have “the first region” in an optimalvibrating state. That is to say, the settings of the first alternatingvoltage has an amplitude ratio (first amplitude ratio) and time phasedifference (first time phase difference) for the alternating voltages tobe applied to each of the first and second piezoelectric elements.Similarly, the settings of the second alternating voltage have a secondamplitude ratio and second time phase difference. Similarly, thesettings of the third through fifth alternating voltages have a thirdthrough fifth voltage amplitudes and third through fifth time phasedifference. That is to say, the settings of the n'th alternating voltagecorresponding to the n'th region are expressed by the amplitude ratio(n'th amplitude ratio) and time phase difference (n'th time phasedifference) of the alternating voltages.

The computations of the alternating voltage settings are performed usingthe values expressed in FIG. 8. The computations of each of thealternating voltage settings are performed using the intermediate valueof α(3, b) in each corresponding region. The responses of the vibrationsin the first and second vibration modes have uniform responses in theup/down direction (second direction B). In all of the regions, α(1)=1,α(2)=1, β(1)=−165°, and β(2)=15° hold. In regions 5 and 6, which are thefirst region where the first alternating voltage is set, α(3, b) is 0.3to 0.5, and the intermediate value thereof of 0.4 is used. In thesettings for other alternating voltages also, similarly the intermediatevalue in the α(3, b) range is used. In a region sandwiched by two nodallines C that are parallel to the first direction A in FIG. 7B, β(3, b)is −157°, and outside thereof is 23°. Corresponding thereto, the valuesof β(3, b) are those expressed in FIG. 8. The setting values of thealternating voltages in regions 3 and 8 which are the third region inwhich the third alternating voltage is set are described as −157° or23°, but the response amplitude gain α(3, b) used here is zero, so thevalues do not have actual meaning.

The displacement distribution in the up/down direction (second directionB) in the fourth vibration mode is the same as the third vibration mode,whereby α(4, b)∝α(3, b) holds. α(3, b) and α(4, b) also have maximumvalues in the center portion in the up/down direction (second directionB) and at the upper and lower ends, where the former is 0.5 and thelatter is 0.25. Thus, we see that α(4, b)=0.5×α(3, b). In a regionsandwiched by two nodal lines C that are parallel to the first directionA in FIG. 7B, β(4, b) is −12°, and outside thereof is 168°.Corresponding thereto, the values of β(4, b) are those expressed in FIG.8. The setting values of the alternating voltage in regions 3 and 8which are the third region in which the third alternating voltage is setare described as −12° or 168°, but the response amplitude gain α(4, b)used here is zero, whereby the values do not have actual meaning.

Using the values expressed in FIG. 8, the Expressions (5) through (8),and the Expressions (11) through (20), the settings of each alternatingvoltage are computed, where X(0)=100 which is the same as the specificvoltage settings based on the above-described related art.

From the values expressed in FIG. 8 and the Expressions (12), (14),(16), and (18), the values of α(10, b), β(10, b), α(11, b), and β(11, b)which are used to set the alternating voltages are as expressed in FIG.9A. From the values expressed in FIG. 9A and from the Expressions (11),(13), (15), (17), (19), and (20), the V(difference), θ(difference),V(sum), and θ(sum) are as noted in FIG. 9B. From the values expressed inFIG. 9B and from the Expressions (5) through (8), V(1), θ(1), V(2), andθ(2) are as noted in FIG. 9C. Also, the values of the voltage amplituderatio ∈ and the time phase difference δ are expressed in FIG. 9C. Thefirst through fifth voltage amplitude ratios ∈ have mutually differentvalues. The first through fifth time phase differences δ also havemutually different values.

Now, regarding the settings of the alternating voltages, the vibrationstate within a corresponding region will be described. In each region,the locations used to compute the corresponding alternating voltagesettings are X(10)=X(11)=X(0)=100, and φ(1)−φ(2)=90°, and are in anoptical vibration state. The vibration state worsens as the locationmoves farther away, and within a region, the border of the region(hereinafter region border) has the lesser vibration state.

The vibration state in the region border herein will be computed. FIG.10 expresses the values of α(1), β(1), α(2), β(2), α(3, b), β(3, b),α(4, b), and β(4, b), at the region border. From the values expressed inFIG. 10 and the Expressions (12), (14), (16), and (18), the values ofα(10, b), β(10, b), α(11, b), and β(11, b) will be as those expressed inFIG. 11. From the values in FIG. 11, from the values of the alternatingvoltage settings in FIG. 9B, and from the Expressions (11), (13), (15),and (17), the vibrating state at the region border in each of thealternating voltage settings will be as those expressed in FIG. 12A.

Now, advantages of the present embodiment as to the related art will bedescribed. As described up to this point, the optimal vibration state toefficiently move dust or the like is a state where the tenth ordervibrations and eleventh order vibrations are the same size and have a90° time phase difference. As an index thereof, the value of X(10,b)/X(11, b) and the value of φ(10, b)−φ(11, b) may be used. The closerX(10, b)/X(11, b) is to 1, the more favorable the value is, and also thecloser φ(10, b)−φ(11, b) is to 90°, the more favorable the value is.

The settings of the driving voltage by the related art as describedabove uses a pair of alternating voltage settings as to the entireoptical device 1. That is to say, the voltage amplitude ratio and timephase difference of the two driving voltages are fixed. At a position ofnodal lines that are parallel to the first direction A in the third andfourth vibration modes, X(1)=X(2)=X(10, b)=X(11, b) holds, and X(10,b)/X(11, b) becomes 1. Also, φ(1)−φ(2)=90° where φ(1)=φ(10, b) andφ(2)=φ(11, b), whereby φ(10, b)−φ(11, b)=90°. However, for example, thecenter portion in the up/down direction (second direction B) or upperand lower end portions where α(3, b) and α(4, b) are the maximum valueshas the vibration state different from the vibration state at theposition of nodal lines. As described above, at the center portion here,X(10, b)=150, φ(10, b)=−162°, X(11, b)=125, and φ(11, b)=−254° holds.Thus, φ(10, b)−φ(11, b)=−162°−(−254°)=92°, where X(10, b)/X(11,b)=150/125=1.2. At the upper and lower end portions, X(10, b)=51, φ(10,b)=−173°, X(11, b)=75, and φ(11, b)=−256°. Thus, φ(10, b)−φ(11,b)=−173°−(−256°)=83°, where X(10, b)/X(11, b)=51/75=0.68. In a worsevibrating state, φ(10, b)−φ(11, b)=83°, where X(10, b)/X(11, b)=0.68 atthe upper and lower end portions. Now, there is a 32% difference inX(10, b)/X(11, b) as to the optimal state, and there is a 7° differencein φ(10, b)−φ(11, b).

On the other hand, in the driving voltage settings according to thepresent embodiment, upon calculating X(10, b)/X(11, b) and φ(10,b)−φ(11, b) at the region borders making up a region where the samealternating voltage is set, that expressed in FIG. 12B is the result.Computations use the X(10, b), X(11, b), φ(10, b), and φ(11, b) in FIG.12A described above.

The driving procedures according to the present embodiment switches thedriving voltage settings from the first to the fifth alternatingvoltages, sequentially in a time-series manner, in units of apredetermined amount of time, and switches the amplitude distributionand phase distribution of the combined vibrations generated in thevibrating body, in a time-series manner. That is to say, according tothe present embodiment, the voltage amplitude ratio of the drivingvoltages is changed in a time-series manner from the voltage amplituderatio of the first alternating voltages to the voltage amplitude ratioof the n'th alternating voltages, and the phase difference of thedriving voltages is changed in a time-series manner from the phasedifference of the first alternating voltages to the n'th alternatingvoltages. Thus, the region corresponding to each of the alternatingvoltage settings are caused to be in a favorable vibration state. Thelocations in the worse vibration regions in each corresponding regionare the positions at the region borders, and are as expressed in FIG.12B. As in FIG. 12B, the vibration state that is worst is the upper andlower end portions of the regions 1 through 10 in the settings of thefifth alternating voltage, and are φ(10, b)−φ(11, b)=87.6° where X(10,b)/X(11, b)=0.90. X(10, b)/X(11, b) is a difference of 10% as to theoptimal state of X(10, b)/X(11, b)=1 and φ(10, b)−φ(11, b)=90°, andφ(10, b)−φ(11, b) has a difference of 2.4°.

In the event that the driving procedures are completed, all of thelocations of the optical device 1 experience a more favorable vibrationstate. According to the related art, X(10, b)/X(11, b) is a differenceof 32% as to the optimal state of X(10, b)/X(11, b)=1 and φ(10, b)−φ(11,b)=90°, and φ(10, b)−φ(11, b) has a difference of 7°, whereby X(10,b)/X(11, b) of the present embodiment is more favorable, and also φ(10,b)−φ(11, b) is more favorable, whereby at all of the locations of theoptical device 1, dust or the like may be more efficiently moved. Also,in the region borders, X(10, b) and X(11, b) is made up of a valuenearer the target value X(0)=100 as compared to the related art.

Now, according to the present embodiment, so as to change the amplitudedistribution of the combined vibrations, at least one of the voltageamplitude ratio and time phase difference of the driving voltages may bechanged, but as described according to the present embodiment, changingboth the voltage amplitude ratio and time phase difference is favorable.

Also, according to the present embodiment, not only may the amplitudedistribution of the combined vibrations be changed in a time-seriesmanner, but also the phase distribution of the combined vibrations maybe changed in a time-series manner.

Further, in the event of changing the voltage amplitude ratio and timephase difference of the driving voltages in a time-series manner,changes made be made smoothly or may be instantaneously switched.

Piezoelectric Material

The piezoelectric material used for the piezoelectric element accordingto the present embodiment has a lead content of less than 1000 ppm. Thepiezoelectric material used in dust removal apparatuses with the relatedart has been mostly a piezoelectric ceramic, the main component of whichis zirconate titanate. Therefore, for example if the dust removalapparatus is discarded and subjected to acid precipitate, or disposed ina severe environment, the lead components in the piezoelectric materialmay leak into the ground and cause harm to life systems. However, if thelead content is less than 1000 ppm, even if the dust removal apparatus470 is discarded and subjected to acid precipitate, or disposed in asevere environment, the probability that the lead components within thepiezoelectric material 431 will harm the environment is small.

The lead content of the piezoelectric material may be evaluated by thelead content as to the total weight of the piezoelectric material asmeasured by a fluorescent X-ray analysis (XRF) or ICP emissionspectrochemical analysis.

A piezoelectric ceramic, the main component of which is barium titanate,is a favorable piezoelectric material according to the presentembodiment. With such a non-lead piezoelectric ceramic, at present,various types of features have not realized an excellent material thatrivals a piezoelectric ceramic, the main component of which is zirconatetitanate. However, in the case that the piezoelectric material is apiezoelectric ceramic, the main component of which is barium titanate,the elasticity is greater than that of zirconate titanate. The vibrationapparatus according to the present embodiment generates an out-of-planevibration in the optical element 1 which is an elastic body, by thestretching vibrations in the lengthwise direction of the piezoelectricelements 2 a and 2 b, but if the elasticity of the piezoelectricelements 2 a and 2 b is great, then even if the piezoelectric featuressuch as piezoelectric constant or the like does not influence thezirconate titanate slightly, a similar out-of-plane vibration as thatwith the related art may be generated in the optical element 1.Therefore, the piezoelectric material according to the presentembodiment takes into consideration environmental aspects, so having apiezoelectric ceramic, the main component of which is barium titanate,is favorable.

Note that the term ceramic as described in the present Specification hasa metal oxide as the basic component thereof, and indicates a so-calledpoly crystal which is an aggregate of crystals (also called bulk unit)that has been baked hard by a heating process. This includes that whichis processed after sintering.

The piezoelectric material according to the present embodiment isexpressed by General Expression (1) below.

(Ba_(1-x)Ca_(x))(Ti_(1-y)Zr_(y))O₃ (0.02≦x≦0.30, 0.020≦y≦0.095, andy≦x)  General Expression (1)

A perovskite-like metal oxide expressed above is favorable as the maincomponent.

According to an embodiment, a perovskite-like metal oxide indicates ametal oxide, ideally having perovskite configuration which is a cubicstructure, as described in Iwanami Science Dictionary, Fifth Edition(Iwanami Books, issued Feb. 20, 1998). Metal oxides having a perovskiteconfiguration are generally expressed by the chemical formula ABO₃. In aperovskite-like metal oxide, the elements A and B take a predeterminedposition in ion-form in unit grids called A-site and B-site. For exampleif the unit grid is of a cubic crystal, the A element is positioned atthe apex of the cube, and the B element is positioned at the bodycenter. The O element takes a face center position of the cube as anegative ion of oxygen.

The metal oxide expressed in the General Expression (1) above means thatthe metallic elements positioned at the A-site are Ba and Ca, and themetallic elements positioned at the B-site Ti and Zr. However, a portionof the Ba and Ca may be positioned at the B-site. Similarly, a portionof the Ti and Zr may be positioned at the A-site.

In the General Expression (1), the mol ratio of the element at theB-site and the O element is 1:3, but even in the case of the mol ratioslightly shifting (e.g., 1.00:2.94 to 1.00:3.06), if the metal oxide isprimarily perovskite-like, this is included in the scope of thedisclosure.

Whether the metal oxide is perovskite-like may be determined byconfiguration analysis by X-ray diffraction or electron diffraction.

In the General Expression (1), x indicating the mol ratio of Ca at theA-site is in the range of 0.02≦x≦0.30. If x is smaller than 0.02, thendielectric loss (tan δ) increases. If dielectric loss increases, theheat generation occurring in the event that the piezoelectric element430 has voltage applied thereto and is driven increases, resulting inthe possibility of decreased driving effectiveness. On the other hand,if x is greater than 0.30, the piezoelectric features may not besufficient.

In the General Expression (1), y indicating the mol ratio of Zr at theB-site is in the range of 0.020≦y≦0.095. If y is smaller than 0.020,then the piezoelectric features may not be sufficient. On the otherhand, if y is greater than 0.095, then Curie temperature (Tc) is loweredto less than 85° C., whereby the piezoelectric features may vanish at ahigh temperature.

According to the present Specification, Curie temperature refers to thetemperature at which ferroelectricity vanishes. An identifying methodthereof may be a method to directly measure the temperature at whichferroelectricity vanishes, while changing the measurement temperature,as well as a method to measure permittivity while changing themeasurement temperature using a minute alternating electric field, andobtain the temperature from a temperature that indicates thepermittivity to be extremely large.

In the General Expression (1), the Ca mol ratio x and the Zr mol ratio yis within a range of y≦x. If y>x, then dielectric loss increases, andinsulation may become insufficient. Also, if the ranges of x and ydescribed up to this point are simultaneously satisfied, a phasetransition temperature T may be moved from nearly room temperature tolower than the operating temperature, and the piezoelectric element 430may be driven over a wide temperature range and with stability.

Also, in the General Expression (1), it is favorable for A/B, whichindicates the ratio of the mol amount of Ba and Ca at the A-site and themol amount of Ti and Zr at the B-site, to be within a range of1.00≦A/B≦1.01. If A/B is smaller than 1.00, then abnormal grain growthmay occur readily, and mechanical strength of the piezoelectric materialmay decrease. On the other hand, if A/B is greater than 1.01, then thetemperature needed for grain growth is increased too high, and with ageneral kiln the density may not be sufficiently large, or thepiezoelectric material may have multiple pores and defects.

It is preferable for the piezoelectric material according to the presentembodiment to have a main component of perovskite-like metal oxide whichis expressed by the General Expression (1) above, to have an Mn contentin the metal oxide, and for the Mn content 0.02 parts by weight orgreater and 0.40 parts by weight or less by metallic conversion as tothe as to 100 parts by weight of a metal oxide.

When Mn is contained within this range, insulation properties and amechanical quality coefficient Qm increases. The increase in insulationproperties and mechanical quality coefficient Qm may originate from adefect dipole being introduced by Mn which has different valences fromTi and Zr, and an internal electric field being generated. If aninternal electric field exists, reliability of the piezoelectric elementmay be secured in the event of the piezoelectric element having voltageapplied thereto and being driven.

Now, the metallic conversion indicating the Mn content expresses a valuethat is obtained from the ratio between the Mn weight percentage, wherethe elements making up the metal oxide expressed in General Expression(1) are subjected to oxide reduction from the content of the metals Ba,Ca, Ti, Zr, and Mn which are measured by a fluorescent X-ray analysis(XRF), ICP emission spectrochemical analysis, or atomic absorptionanalysis from the piezoelectric material, when the total weight thereofis 100.

If the Mn content is less than 0.02 parts by weight, the advantages ofthe polarization treatment needed to drive the piezoelectric elementbecomes insufficient. On the other hand, if the Mn content is greaterthan 0.40 parts by weight, the piezoelectric features may becomeinsufficient, or unforeseen crystals in a hexagonal form may appear inthe piezoelectric features.

Mn is not limited to metallic Mn, and may be included in thepiezoelectric material as an Mn component, and the form of the contentthereof is not limited. For example, a solid solution may be at theB-site, and may be included in grain boundaries. Also, Mn components maybe included in the piezoelectric material in the form of metal, ion,oxide, metal salt, a complex, or the like. A more favorable form of thecontent is to have a solid solution at the B-site, from the perspectiveof insulation properties and ease of sintering. In the case of a solidsolution at the B-site, if we say that the ratio of the mol amount of Baand Ca at the A-site and the mol amount of Ti, Zr, and Mn at the B-siteis A/B, the favorable A/B range is 0.993≦A/B≦0.998. The piezoelectricelements where A/B is within this range have a large stretchingvibration in the lengthwise direction of the piezoelectric element, andsince the mechanical quality coefficient is high, excels in dustremoving capabilities, whereby a dust removing device having excellentdurability may be obtained. Also, the piezoelectric material may includethe General Expression (1) and a range where the features do not modifythe components (sub-components) other than Mn.

EXAMPLES

The piezoelectric material used for the piezoelectric element accordingto the present embodiment described above will be described in detail,giving an example below, but the embodiments are not limited to theexample below.

Manufacturing Example 1

Barium titanate having an average grain diameter of 100 nm (BT-01,manufactured by Sakai Chemical Industry Co., Ltd.), calcium titanatehaving an average grain diameter of 300 nm (CT-03, manufactured by SakaiChemical Industry Co., Ltd.), and calcium zirconate having an averagegrain diameter of 300 nm (CZ-03, manufactured by Sakai Chemical IndustryCo., Ltd.) are weighed so as to have a mol ratio of 83.0:10.5:6.5 (seeTable 1).

Next the weighed grains are mixed by 24-hour dry blending using a ballmill. In order to granulate the obtained mixed grains, manganese acetate(II) having a 0.18 parts by weight Mn by metallic conversion as to themixed grains and a PVA binder having 3 parts by weight as to the mixedgrains are adhered to the mixed grain surfaces using a spray dryerapparatus.

Next, the obtained grains are poured into a metal form, a formingpressure of 200 MPa is applied using a press compacting machine, and adisc-shaped compact is created. This compact may be further pressedusing a cold isostatic press.

The obtained compact is placed in an electric kiln, maintained for fivehours at a maximum temperature of 1340° C., and sintered in theatmosphere for a total of 24 hours.

Next, the composition is evaluated by a fluorescent X-ray analysis. As aresult, we may see that Mn content of 0.18 parts by weight is in thecomposition which may be expressed by a chemical formula of(Ba_(0.830)Ca_(0.170))(Ti_(0.935)Zr_(0.065))O₃. This indicates that theweighed composition and the composition after sintering are the same.Also, elements other than Ba, Ca, Ti, Zr, and Mn have an amount of lessthan the detection limit, and are less than 1 part by weight.

Further, crystal compositions were analyzed by X-ray analysis at 25° C.and at −70° C. Consequently, just peaks that are similar to theperovskite configuration were observed. Also, as a result of subjectingthe X-ray analysis to Rietveld analysis, crystalline phases that aretetragon at 25° C. and rhombic at −70° C. were found.

Manufacturing Example 1 for Comparison

In order to manufacture grains of Barium titanate having an averagegrain diameter of 100 nm (BT-01, manufactured by Sakai Chemical IndustryCo., Ltd.), manganese acetate (II) having 0.12 parts by weight Mn bymetallic conversion as to the mixed grains and a PVA binder having 3parts by weight as to the mixed grains are adhered to the mixed grainsurfaces using a spray dryer apparatus.

Next, the obtained grains are poured into a metal form, a formingpressure of 200 MPa is applied using a press compacting machine, and adisc-shaped compact is created. The obtained compact is placed in anelectric kiln and maintained for five hours at a maximum temperature of1380° C., and fired in the atmosphere for a total of 24 hours.

Next, the composition is evaluated by a fluorescent X-ray analysis. As aresult, we may see that Mn content of 0.12 parts by weight is in thecomposition which may be expressed by a chemical formula of BaTiO₃.Also, elements other than Ba, Ca, Ti, Zr, and Mn have an amount of lessthan the detection limit, and are less than 1 part by weight.

Further, the crystal compositions were analyzed by X-ray analysis at 25°C. and at −70° C. Consequently, just peaks that are similar to theperovskite configuration were observed. Also, as a result of subjectingthe X-ray analysis to Rietveld analysis, crystalline phases that aretetragon at 25° C. and rhombic at −70° C. were found.

Manufacturing Example 2 for Comparison

A sintered compact of zirconate titanate is prepared. Further, thecrystal compositions were analyzed by X-ray analysis at 25° C. and at−70° C. Consequently, just peaks that are similar to the perovskiteconfiguration were observed. Also, as a result of subjecting the X-rayanalysis to Rietveld analysis, crystalline phases that are tetragon at25° C. and rhombic at −70° C. were found.

Embodiment 1 and Comparison Example 1

Piezoelectric material for the manufacturing example 1 and amanufacturing example 1 for comparison is used to create a piezoelectricelement for the Embodiment 1 and comparison example 1.

The piezoelectric material is subjected to a polishing process to athickness of 0.5 mm, Ti and Au in the order of Ti, Au are formed on twofaces by DC magnetron sputtering with a thickness of 30 nm and 380 nm,respectively, thereby forming a piezoelectric element having a firstelectrode and second electrode.

Next, upon subjecting the piezoelectric elements to a cut process to10.0 mm×2.5 mm×0.5 mm, the piezoelectric elements are subjected topolarization treatment using a direct current to the piezoelectricelements. The temperature is 100° C., the applied electric field is 1kV/mm, and the voltage application time is 30 minutes. The polarizationaxis direction of the piezoelectric elements is parallel to thethickness direction thereof.

Further, the piezoelectric elements of the Embodiment 1 and ComparisonExample 1 are subjected to minute current electrical field applicationand permittivity measured while changing the measurement temperature,and the phase transition temperature T is evaluated. The result is thatthe phase transition temperature T is −32° C. and 6° C. in theEmbodiment 1 and Comparison Example 1, respectively.

Comparison Example 2

A piezoelectric element of a comparison example 2 is manufactured usingthe piezoelectric material of the manufacturing example 2 forcomparison. The piezoelectric material is subjected to a polishingprocess to a thickness of 0.25 mm, Ti and Au in the order of Ti, Au areformed on two faces by DC magnetron sputtering with a thickness of 30 nmand 380 nm, respectively, thereby forming a piezoelectric element havinga first electrode and second electrode.

Next, upon subjecting the piezoelectric elements to a cut process to10.0 mm×2.5 mm×0.5 mm, the piezoelectric elements are subjected topolarization treatment using a direct current to the piezoelectricelements. The temperature is 200° C., the applied electric field is 1.7kV/mm, and the voltage application time is 30 minutes. The polarizationaxis direction of the piezoelectric elements is parallel to thethickness direction thereof.

Further, the piezoelectric elements of the Comparison Example 2 aresubjected to minute current electrical field application andpermittivity measured while changing the measurement temperature, andthe phase transition temperature T is evaluated. The result is that thephase transition temperature T did not exist at least in the range of−60° C. to 50° C.

Evaluation of Piezoelectric Elements of Embodiment 1 and ComparisonExample 1 and Comparison Example 2

Next, using a resonance-antiresonance method, a piezoelectric constantd₃₁, elastic constant Y₁₁, and resonance frequency for the piezoelectricelements in the embodiment 1, comparison example 1, and comparisonexample 2 are found. The measurement is started at 30° C., andmeasurement is performed while changing the temperature in the order ofincreased temperature, decreased temperature, and increased temperatureup to 30° C. Measurement is performed within a constant-temperatureoven, wherein each temperature is maintained for a fixed amount of time,and after the temperature has stabilized, the piezoelectric constantd₃₁, elastic constant Y₁₁, and resonance frequency are evaluated.

Now, as the temperature of the piezoelectric element of the embodiment 1is decreased, the piezoelectric constant increases, the elastic constantdecreases, and the resonance frequency decreases. On the other hand, asto the piezoelectric element of the comparison example 1, a feature polechange exists near 5° C., and at near 5° C. the piezoelectric constantis maximized, the elastic constant is minimized, and the resonancefrequency is minimized. Also, the piezoelectric element of thecomparison example 2 is not dependent on temperature for any physicalproperties, and remains approximately constant.

Manufacturing Examples 2 through 27

Barium titanate having an average grain diameter of 100 nm (BT-01,manufactured by Sakai Chemical Industry Co., Ltd.), calcium titanatehaving an average grain diameter of 300 nm (CT-03, manufactured by SakaiChemical Industry Co., Ltd.), and calcium zirconate having an averagegrain diameter of 300 nm (CZ-03, manufactured by Sakai Chemical IndustryCo., Ltd.) are weighed so as to have the mol ratio shown in Table 1.

Next the weighed grains are mixed by 24-hour dry blending using a ballmill. In order to granulate the obtained mixed grains, manganese acetate(II) having the parts-by-weight shown in Table 1 of Mn as to the mixedgrains, and a PVA binder having 3 parts by weight by metallic conversionas to the mixed grains, are adhered to the mixed grain surfaces using aspray dryer apparatus.

Next, the obtained grains are poured into a metal form, a formingpressure of 200 MPa is applied using a press compacting machine, and adisc-shaped compact is created. This compact may be further pressedusing a cold isostatic press.

The obtained compact is placed in an electric kiln, maintained for fivehours at a maximum temperature of 1350° C. to 1480° C., and sintered inthe atmosphere for a total of 24 hours. The maximum temperature isincreased as the amount of Ca increased.

Next, the composition is evaluated by a fluorescent X-ray analysis. As aresult, we may see that Mn content of the percent of the weight shown inTable 1 is in the composition (x and y are described in Table 2) whichmay be expressed by a chemical formula of(Ba_(1-x)Ca_(x))(Ti_(1-y)Zr_(y))O₃. Also, elements other than Ba, Ca,Ti, Zr, and Mn have an amount of less than the detection limit, and areless than 1 percent of the weight.

Further, crystal compositions were analyzed by X-ray analysis at 25° C.and at −70° C. Consequently, just peaks that are similar to theperovskite configuration were observed. Also, as a result of subjectingthe X-ray analysis to Rietveld analysis, crystalline phases that aretetragon at 25° C. and rhombic at −70° C. were found.

Embodiments 2 through 27

Piezoelectric elements of second through twenty-seventh embodiments aremanufactured, using the piezoelectric material in manufacturing examples2 through 27.

The piezoelectric material is subjected to a polishing process to athickness of 0.5 mm, Ti and Au in the order of Ti, Au are formed on twofaces by DC magnetron sputtering with a thickness of 30 nm and 380 nm,respectively, thereby forming a piezoelectric element having a firstelectrode and second electrode.

Next, upon subjecting the piezoelectric elements to a cut process to10.0 mm×2.5 mm×0.5 mm, the piezoelectric elements are subjected topolarization treatment using a direct current to the piezoelectricelements. The temperature is 100° C., the applied electric field is 1kV/mm, and the voltage application time is 30 minutes. The polarizationaxis direction of the piezoelectric elements is parallel to thethickness direction thereof.

Further, the piezoelectric elements of the second through twenty-seventhembodiments are subjected to minute current electrical field applicationand permittivity measured while changing the measurement temperature,and the phase transition temperature T is evaluated. The result is thatthe phase transition temperature T is the temperature shown in Table 2.

TABLE 1 Mn parts by weight BaTiO₃ CaTiO₃ CaZrO₃ [% by [mol] [mol] [mol]Weight] Manufacturing Example 1 83.00 10.50 6.50 0.18 ManufacturingExample 2 84.50 11.40 4.10 0.18 Manufacturing Example 3 87.00 8.90 4.100.18 Manufacturing Example 4 85.75 9.75 4.50 0.18 Manufacturing Example5 87.00 8.00 5.00 0.18 Manufacturing Example 6 85.00 10.00 5.00 0.18Manufacturing Example 7 86.00 8.00 6.00 0.18 Manufacturing Example 886.00 8.00 6.00 0.16 Manufacturing Example 9 86.00 8.00 6.00 0.14Manufacturing Example 10 81.30 12.70 6.00 0.24 Manufacturing Example 1181.30 12.70 6.00 0.24 Manufacturing Example 12 81.30 12.70 6.00 0.24Manufacturing Example 13 83.00 10.10 6.90 0.18 Manufacturing Example 1483.00 11.00 6.00 0.18 Manufacturing Example 15 84.00 10.10 5.90 0.18Manufacturing Example 16 87.00 7.00 6.00 0.15 Manufacturing Example 1784.00 11.00 5.00 0.18 Manufacturing Example 18 83.00 10.10 6.90 0.18Manufacturing Example 19 83.00 10.50 6.50 0.18 Manufacturing Example 2083.00 11.00 6.00 0.18 Manufacturing Example 21 84.00 10.10 5.90 0.18Manufacturing Example 22 84.00 10.50 5.50 0.18 Manufacturing Example 2384.00 11.00 5.00 0.18 Manufacturing Example 24 83.00 10.10 6.90 0.24Manufacturing Example 25 83.00 10.10 6.90 0.30 Manufacturing Example 2684.00 10.10 5.90 0.24 Manufacturing Example 27 84.00 10.10 5.90 0.30Manufacturing Example 1 for 100.00 0.00 0.00 0.12 Comparison

TABLE 2 Mn parts by Sub- weight Component Phase Transition [% by [% byTemperature after x y Weight] Weight] Polarization [° C.] Embodiment 1Manufacturing Example 1 0.1700 0.065 0.18 0.0 −32 Embodiment 2Manufacturing Example 2 0.1550 0.041 0.18 0.0 −46 Embodiment 3Manufacturing Example 3 0.1300 0.041 0.18 0.0 −40 Embodiment 4Manufacturing Example 4 0.1425 0.045 0.18 0.0 −44 Embodiment 5Manufacturing Example 5 0.1300 0.050 0.18 0.0 −29 Embodiment 6Manufacturing Example 6 0.1500 0.050 0.18 0.0 −44 Embodiment 7Manufacturing Example 7 0.1400 0.060 0.18 0.0 −20 Embodiment 8Manufacturing Example 8 0.1400 0.060 0.16 0.0 −16 Embodiment 9Manufacturing Example 9 0.1400 0.060 0.14 0.0 −16 Embodiment 10Manufacturing Example 10 0.1870 0.060 0.24 0.0 −38 Embodiment 11Manufacturing Example 11 0.1870 0.060 0.24 0.0 −62 Embodiment 12Manufacturing Example 12 0.1870 0.060 0.24 0.0 −60 Embodiment 13Manufacturing Example 13 0.1700 0.069 0.18 0.0 −24 Embodiment 14Manufacturing Example 14 0.1700 0.060 0.18 0.0 −34 Embodiment 15Manufacturing Example 15 0.1600 0.059 0.18 0.0 −38 Embodiment 16Manufacturing Example 16 0.1300 0.500 0.15 0.0 −5 Embodiment 17Manufacturing Example 17 0.1600 0.050 0.18 0.0 −52 Embodiment 18Manufacturing Example 18 0.1700 0.069 0.18 0.0 −26 Embodiment 19Manufacturing Example 19 0.1700 0.065 0.18 0.0 −36 Embodiment 20Manufacturing Example 20 0.1700 0.060 0.18 0.0 −40 Embodiment 21Manufacturing Example 21 0.1600 0.059 0.18 0.0 −36 Embodiment 22Manufacturing Example 22 0.1600 0.055 0.18 0.0 −40 Embodiment 23Manufacturing Example 23 0.1600 0.050 0.18 0.0 −50 Embodiment 24Manufacturing Example 24 0.1700 0.069 0.24 0.0 −20 Embodiment 25Manufacturing Example 25 0.1700 0.069 0.30 0.0 −20 Embodiment 26Manufacturing Example 26 0.1600 0.059 0.24 0.0 −42 Embodiment 27Manufacturing Example 27 0.1600 0.059 0.30 0.0 −42 ComparisonManufacturing Example 1 0.0000 0.000 0.12 0.0 6 Example 1 for Comparison

Other Embodiments

The vibration apparatus and driving method of the first embodiment maybe provided to a scanner part of a photocopier which is another opticaldevice and use to remove dust, or may be used in a driving device tomove toner which is a powder. The dust or powder that is positioned in aregion over a wide range may be efficiently moved, and a thin type ofdust removing device or driving apparatus may be realized. The targetitem to be moved (driven body) of the dust removing device is notlimited to dust or powder, but a solid or gas or liquid may also bemoved. Also, the driving apparatus drives a driven body by a vibrationapparatus. An example of the driven body may be a constructed body to bedriven (e.g., a constructed body such as a holder or the like to hold alens), or a sheet member or the like. According to the first embodiment,vibration modes to be considered are given as first through fourthvibration modes, but if other vibration modes are added thereto andsetting values of the alternating voltages are computed, the advantagesfurther increase. Also, of the unnecessary vibration modes, thevibration mode having more influence is the third vibration mode, andcompared thereto the influence order of the fourth vibration mode isrelatively small. Accordingly, in the event of computing the settings ofthe alternating voltages, the fourth vibration mode is omitted from thecalculations as needed, the advantages are still obtained. Also, as avibration mode to be dedicated primarily to moving dust, according tothe first embodiment the out-of-plane tenth order bending vibration mode(first vibration mode) and the out-of-plane eleventh order bendingvibration mode (second vibration mode) are used, but the embodiments arenot limited to the combination of these vibration modes. For example,the out-of-plane primary bending mode and out-of-plane secondary bendingmode may be combined. Also, the out-of-plane m'th order bending mode andout-of-plane n'th order bending mode may be combined. In this case, mand n only have to be different natural numbers. Regardless of thecombination of vibration modes dedicated primarily to moving dust, byconsidering the responses of other vibration modes, and by setting theregions and alternating voltages, and driving, the advantages may beobtained.

According to the first embodiment, there are ten regions, andrecognizing the symmetry of the vibration responses, regions having thesame vibration responses are selected, and the same alternating voltageis set in one region which is a combination of the regions having thesame vibration responses. Thus, five regions having differentalternating voltages are set. However, the number of regions in which toset the same alternating voltages is not limited to five. If there aretwo or more regions having different alternating voltages, an optimalvibration state may be realized for each region, and the advantage ofmoving a driven object including dust efficiently in a predetermineddirection, may be obtained.

Also, “alternating voltage settings” includes the voltage amplituderatio of the alternating voltage and the time phase difference of thealternating voltage. Settings of a first alternating voltage having afirst voltage amplitude ratio and first time phase difference aredetermined as to the first region of the vibrating body. Settings of asecond alternating voltage having a second voltage amplitude ratio andsecond time phase difference are determined as to the second region ofthe vibrating body, which differs from the first region. Now, at leastone of the first voltage amplification ratio and second voltageamplification ratio, or the first time phase difference and second timephase difference, is different. By switching between the firstalternating voltages settings and the second alternating voltagessettings, and driving the vibrating body, an optimal vibration state maybe realized for each region, and the advantage of efficiently moving thedriven target, including dust, in the predetermined direction may beobtained. Thus, the number of regions is not limited to the numberexemplified in the embodiment. Also, according to the first embodiment,a third vibration mode and fourth vibration mode are considered, havingthe same displacement distribution in the left/right direction (firstdirection A) as the first and second vibration modes, as unnecessaryvibration modes. Therefore, the displacement distribution in theleft/right direction (first direction A) of the vibrations excited inthe optical element 1 is not changed by the vibrations of the third andfourth vibration modes. Accordingly, a region divided in the left/rightdirection (first direction) is not provided. However, unlike the firstembodiment, there are cases where a vibration mode, serving as anunnecessary vibration mode, having a different displacement distributionfrom the first and second vibration modes in the left/right direction(first direction), which are primarily dedicated to moving dust, haslarge vibrations. In such a case, the above-described unnecessaryvibration mode is considered, and a region that virtually divides theoptical element 1 in the left/right direction (first direction A) may beprovided as needed. According to the driving method herein, even in thecase that the displacement distribution in the left/right direction(first direction A) is changed by the vibrations of the unnecessaryvibration mode, an optimal vibration state may be realized for eachregion, and the advantage of moving a driven object including dustefficiently in a predetermined direction, may be obtained.

Also, according to the first embodiment, the setting of φ(10, b)−φ(11,b) is set as 90°, but the embodiment is not limited to 90°, as long asthe time phase difference of the tenth order vibrations and eleventhorder vibrations described above are different. Also, if φ(10, b)−φ(11,b) is a value greater than −180° and smaller than 0°, the direction inwhich the dust or the like is moved may be inverted. Also, even if acombination of a driving voltage and an applying piezoelectric element 2is switched, so that the driving voltage E(1) is applied to thepiezoelectric element 2 b on the right, and the driving voltage E(2) isapplied to the piezoelectric element 2 a on the left, the direction inwhich the dust or the like is moved may be inverted. Settings for suchan inverted alternating voltage may be added to the driving procedures.

According to an embodiment, a driven target which includes dust may beefficiently moved by vibrations in a predetermined direction.

While the disclosure has been described with reference to exemplaryembodiments, it is to be understood that the disclosure is not limitedto the disclosed exemplary embodiments. The scope of the followingclaims is to be accorded the broadest interpretation so as to encompassall such modifications and equivalent structures and functions.

This application claims the benefit of Japanese Patent Application No.2012-063898 filed Mar. 21, 2012, which is hereby incorporated byreference herein in its entirety.

What is claimed is:
 1. A vibration apparatus comprising: a vibratingbody comprising an electromechanical energy converting element having anelectrode, the electromechanical energy converting element comprising apiezoelectric material having a lead content of less than 1000 ppm; anda control unit that generates a combined vibration by generatingmultiple stable waves having mutually different orders with a time phasedifference by applying at least two driving voltages to theelectromechanical energy converting element; wherein the control unitchanges at least one of the voltage amplitude ratio and time phasedifference of at least the two driving voltages, so as to change theamplitude distribution of the combined vibration.
 2. The vibrationapparatus according to claim 1, wherein at least one of the voltageamplitude ratio and time phase difference of the driving voltages ischanged, so as to change the amplitude distribution and phasedistribution of the combined vibration.
 3. The vibration apparatusaccording to claim 1, wherein, in the case that at least one of thevoltage amplitude ratio and time phase difference of at least twoalternating voltages is set for each of a first through n'th region ofthe vibrating body, the voltage amplitude ratio of the alternatingvoltages that are set as to the first region is called the first voltageamplitude ratio, and the time phase difference of the alternatingvoltages is called the first time phase difference, and the voltageamplitude ratio of the alternating voltages that are set as to the n'thregion is called the n'th voltage amplitude ratio, and the time phasedifference of the alternating voltages is called the n'th time phasedifference, the control unit performs at least one of control tosequentially change the voltage amplitude ratio of the driving voltagesin a time-series manner from the first voltage amplitude ratio to then'th voltage amplitude ratio; and control to sequentially change thetime phase difference of the driving voltages in a time-series mannerfrom the first time phase difference to the n'th time phase difference,and wherein n is an integer that is equal to or greater than
 2. 4. Thevibration apparatus according to claim 3, wherein the control unitperforms at least one of control to sequentially switch the voltageamplitude ratio of the driving voltages in predetermined time units in atime-series manner from the first voltage amplitude ratio to the n'thvoltage amplitude ratio; and control to sequentially switch the timephase difference of the driving voltages in predetermined time units ina time-series manner from the first time phase difference to the n'thtime phase difference.
 5. The vibration apparatus according to claim 1,wherein the piezoelectric material is a piezoelectric ceramic havingbarium titanate as the main component thereof.
 6. The vibrationapparatus according to claim 5, wherein the piezoelectric materialcomprises a perovskite-like metal oxide as a main component, theperovskite-like metal oxide being expressed by a General Expression (1)(Ba_(1-x)Ca_(x))(Ti_(1-y)Zr_(y))O₃  (1), wherein x and y satisfy0.02≦x≦0.30, 0.020≦y≦0.095, and y≦x.
 7. The vibration apparatusaccording to claim 6, wherein the piezoelectric material comprises theperovskite-like metal oxide expressed by the General Expression (1) as amain component, wherein the perovskite-like metal oxide includes a Mn,and wherein a Mn content is 0.02 parts by weight or greater and 0.40parts by weight or less with respect to the perovskite-like metal oxideof 100 parts by weight in terms of metal element.
 8. A driving apparatuscomprising: the vibration apparatus according to claim 1; and a drivenbody; wherein the driven body is driven by the vibration apparatus. 9.The vibration apparatus according to claim 1, wherein the vibrationapparatus functions as a dust removing device to move dust on thevibrating body and remove the dust by the combined vibrations.
 10. Anoptical device, comprising: a vibration apparatus, which is the dustremoving device according to claim 9, wherein the vibrating body isprovided on the light path; and an imaging device into which light thathas transmitted the vibrating body enters.